In current CMOS nanometer technologies, aging effects may appear after relatively short operating times, compared to the expected lifetime of circuits. Therefore, especially in high-performance, safety critical systems, there is an increasing need for on-chip aging monitoring. This talk presents a programmable aging sensor that can be embedded in FPGA-based designs, using standard resources available in those devices and with minimal impact on the standard FPGA design flow. The sensing principle is to monitor performance degradation over time and the proposed technique is particularly useful to monitor parametric Process, supply Voltage and Temperature (PVT) and aging-induced variations. Experimental results are presented and discussed, demonstrating the good performance of the proposed sensor, as well as its low cost in terms of area overhead and power consumption.